Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits
Exponential lower bounds on lengths of the following tests are obtained:
1) complete diagnostic tests in presence of one-type or arbitrary constant faults on inputs of circuits;
2) complete diagnostic tests for logic circuits in some bases in presence of one-type or arbitrary constant faults on outputs of gates.
logic circuit, fault, complete diagnostic test, test for inputs of circuits
Mathematical modelling in actual problems of science and technics