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Publication

KIAM Preprint № 60, Moscow, 2016
Authors: Popkov K.A.
Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits
Abstract:
Exponential lower bounds on lengths of the following tests are obtained: 1) complete diagnostic tests in presence of one-type or arbitrary constant faults on inputs of circuits; 2) complete diagnostic tests for logic circuits in some bases in presence of one-type or arbitrary constant faults on outputs of gates.
Keywords:
logic circuit, fault, complete diagnostic test, test for inputs of circuits
Publication language: russian, pages: 12
Research direction:
Mathematical modelling in actual problems of science and technics
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